Invited Lectures I
Kristiaan DE GREVE, IMEC, KU Leuven, Belgium
Nathaiie P. DE LEON, Princeton University, USA
Anton FRISK KOCKUM, Chalmers University, Sweden
Fernando GONZALEZ-ZALBA, Quantum Motion, UK
Georgios KATSAROS, IST Austria, Austria
Jelena KLINOVAJA, University of Basel, Switzerland
Vincenzo LORDI, Lawrence Livermore National Laboratory, USA
Daniel LOSS, University of Basel, Switzerland
Nicola LOVERGINE, University of Salento, Italy
Vladimir MANUCHARYAN, EPFL Lausanne, Switzerland
Andrea MORELLO, University of New South Wales, Australia
Christian OSPELKAUS, Leibniz Universität Hannover, Germany
Patrick PARKINSON, University of Manchester, UK
Rajib RAHMAN, University of New South Wales, Australia
Malte ROESNER, Radboud University, Netherlands
Pasquale SCARLINO, EPFL, Lausanne, Switzerland
Ray SIMMONDS, National Institute of Standards & Technology, USA
Volodymyr SIVAK, Google, USA
Tim TAMINIAU, Delft University of Technology, The Netherlands
Mark E. TURIANSKY, University of California, Santa Barbara, USA
Lieven VANDERSYPEN / Xiao XUE, Delft University of Technology, Netherlands
Justyna P. ZWOLAK, National Institute of Standards and Technology, USA
Nathaiie P. DE LEON, Princeton University, USA
Anton FRISK KOCKUM, Chalmers University, Sweden
Fernando GONZALEZ-ZALBA, Quantum Motion, UK
Georgios KATSAROS, IST Austria, Austria
Jelena KLINOVAJA, University of Basel, Switzerland
Vincenzo LORDI, Lawrence Livermore National Laboratory, USA
Daniel LOSS, University of Basel, Switzerland
Nicola LOVERGINE, University of Salento, Italy
Vladimir MANUCHARYAN, EPFL Lausanne, Switzerland
Andrea MORELLO, University of New South Wales, Australia
Christian OSPELKAUS, Leibniz Universität Hannover, Germany
Patrick PARKINSON, University of Manchester, UK
Rajib RAHMAN, University of New South Wales, Australia
Malte ROESNER, Radboud University, Netherlands
Pasquale SCARLINO, EPFL, Lausanne, Switzerland
Ray SIMMONDS, National Institute of Standards & Technology, USA
Volodymyr SIVAK, Google, USA
Tim TAMINIAU, Delft University of Technology, The Netherlands
Mark E. TURIANSKY, University of California, Santa Barbara, USA
Lieven VANDERSYPEN / Xiao XUE, Delft University of Technology, Netherlands
Justyna P. ZWOLAK, National Institute of Standards and Technology, USA








